Atomic-Resolution Differential Phase Contrast Imaging by STEM
نویسندگان
چکیده
منابع مشابه
Integrated Differential Phase Contrast (iDPC) STEM: A New Atomic Resolution STEM Technique To Image All Elements Across the Periodic Table
A new, recently introduced Integrated Differential Phase Contrast (iDPC) STEM imaging technique [1] is enabling live imaging of the phase of the transmission function of thin samples. One of the first striking advantages of this new technique is that it is able to image light (C, O, N ...) and heavier elements (Sr, Ti, Ga ...) together in one image whereas a standard (HA)ADF-STEM image shows on...
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Understanding the atomic-scale structure of surfaces and interfaces is essential to control the functional properties of many materials and devices. Recent advances in aberration-corrected scanning transmission electron microscopy (STEM) have made possible the direct characterization of localized atomic structure in ceramic materials, especially grain boundaries and heterointerfaces. In STEM, a...
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Various bright-field (BF) imaging modes are available in scanning transmission electron microscopy (STEM). The mode equivalent to phase contrast imaging in conventional high-resolution transmission electron microscopy (TEM) involves a detector about an order of magnitude smaller than the convergence angle of the probe. This means a large proportion of the incident electrons go to waste as most ...
متن کاملIntegrated Differential Phase Contrast (iDPC) – Direct Phase Imaging in STEM for Thin Samples
Imaging the phase of the transmission function has always been the ultimate goal of any (S)TEM imaging technique as it is, for thin samples, directly proportional to the projected potential in the sample. Customarily this information is obtained using Holography [1] or by performing focus series reconstruction in TEM (FSR-TEM) [2], recently also in combination with Phase Plates (PP) [3] and/or ...
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We combined grating-based phase contrast imaging with projection magnification using a high-brilliance microfocus x-ray source. This geometry offers increased detection efficiency even at higher energies for quantitative high-resolution phase contrast imaging. By systematic methodical investigations, it is shown, how the primary measurement signal is affected by the magnification factor. Furthe...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2011
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s143192761100715x